Data | Título | Autor(es) | Tipo | Acesso |
2005 | Ab initio modeling of defects in silicon, germanium and SiGe alloys | Torres, V. J. B.; Coutinho, J.; Carvalho, A., et al. | Poster em conferência | Acesso aberto |
30-Jul-2013 | Charge storage behavior of nanostructures based on SiGe nanocrystals embedded in Al2O3 matrix | Vieira, E. M. F.; Levichev, S.; Dias, Carlos J., et al. | Artigo | Acesso restrito UMinho |
4-Set-2013 | Influence of RF-sputtering power on formation of vertically stacked Si1−xGex nanocrystals between ultra-thin amorphous Al2O3 layers: structural and photoluminescence properties | Vieira, E. M. F.; Martín-Sánchez, J.; Roldan, M. A., et al. | Artigo | Acesso restrito UMinho |
24-Jul-2017 | SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO2 multilayers | Vieira, E. M. F.; Toudert, J.; Rolo, Anabela G., et al. | Artigo | Acesso restrito UMinho |
2012 | Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlattice | Vieira, E. M. F.; Martín-Sánchez, J.; Rolo, Anabela G., et al. | Artigo | Acesso restrito UMinho |