Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/16468
Título: | Charging effects in CdSe nanocrystals embedded in SiO2 matrix produced by rf magnetron sputtering |
Autor(es): | Levichev, S. Chahboun, A. Basa, P. Rolo, Anabela G. Barradas, N. P. Alves, E. Horvath, Zs. J. Conde, O. Gomes, M. J. M. |
Palavras-chave: | CdSe Nanocrystals SiO2 Charging effect |
Data: | 16-Set-2008 |
Editora: | Elsevier |
Revista: | Microelectronic Engineering |
Resumo(s): | Charging effects in CdSe nanocrystals embedded in SiO2 matrix fabricated by rf magnetron co-sputtering technique were electrically characterized by means of capacitance–voltage (C–V) combined with current–voltage (I–V). The presence of CdSe nanocrystals was demonstrated by X-ray diffraction technique. The average size of nanocrystals was found to be approximately 3 nm. The carriers transport in the CdSe/SiO2 structure was shown to be a combination of Fowler–Nordheim tunnelling and Poole–Frenkel mechanisms. A memory effect was demonstrated and a retention time was measured. |
Tipo: | Artigo |
Descrição: | S.L. thanks FCT for the financial support through the Grant SFRH/BPD/26532/ 2006. |
URI: | https://hdl.handle.net/1822/16468 |
DOI: | 10.1016/j.mee.2008.09.003 |
ISSN: | 0167-9317 |
Versão da editora: | http://www.sciencedirect.com/science/article/pii/S0167931708003948 |
Arbitragem científica: | yes |
Acesso: | Acesso restrito UMinho |
Aparece nas coleções: | CDF - FMNC - Artigos/Papers (with refereeing) |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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Charging effects in CdSe nanocrystals embedded in SiO2 matrix produced by rf magnetron sputtering.pdf Acesso restrito! | Documento principal | 311,18 kB | Adobe PDF | Ver/Abrir |