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Issue DateTitleAuthor(s)TypeAccess
2011Revestimentos decorativos pelo efeito SPR obtido pela adição de Au a matrizes dieléctricasFigueiredo, N. M.; Vaz, F.; Cunha, L.; Cavaleiro, A.ArticleOpen access
2001Elastic properties of (Ti,Al,Si) N nanocomposite filmsCarvalho, S.; Vaz, F.; Rebouta, L.; Schneider, D.; Cavaleiro, A.; Alves, E.ArticleOpen access
3-Jan-2006Properties of MoNxOy thin films as a function of N/O ratioBarbosa, José Gusman; Cunha, L.; Rebouta, L.; Moura, C.; Vaz, F.; Carvalho, S.; Alves, E.; Le Bourhis, E.; Goudeau, Ph.; Rivière, J. P.ArticleOpen access
2010Development of new decorative coatings based on gold nanoparticles dispersed in an amorphous TiO2 dielectric matrixTorrell, M.; Machado, P.; Cunha, L.; Figueiredo, N. M.; Oliveira, J. C.; Louro, C.; Vaz, F.ArticleOpen access
2010Influence of composition and structural properties in the tribological behaviour of magnetron sputtered Ti–Si–C nanostructured thin films, prepared at low temperatureMunteanu, D.; Ionescu, C.; Olteanu, C.; Munteanu, A.; Davin, F.; Cunha, L.; Moura, C.; Vaz, F.ArticleOpen access
Mar-2009Optical properties of titanium oxycarbide thin filmsMarques, L.; Pinto, H.; Fernandes, Ana C.; Banakh, O.; Vaz, F.; Ramos, Marta M. D.ArticleOpen access
2009Structural evolution of Ti-Al-Si-N nanocomposite coatingCarvalho, S.; Rebouta, L.; Ribeiro, E.; Vaz, F.; Tavares, C. J.; Alves, E.; Barradas, N. P.; Rivière, J. P.ArticleOpen access
2008Effect of the microstructure on the cutting performance of superhard (Ti, Si, Al)N nanocomposite filmsFernandes, C.; Carvalho, S.; Rebouta, L.; Vaz, F.; Denannot, M. F.; Pacaud, J.; Rivière, J. P.; Cavaleiro, A.ArticleOpen access
12-Sep-2017Corrosion behavior of titanium oxynitrided by diffusion and magnetron sputtering methods in physiological solutionPohrelyuk, I. M.; Yaskiv, O. I.; Tkachuk, O. V.; Barradas, N. P.; Alves, E.; Vaz, F.; Cunha, L.ArticleRestricted access (UMinho)
Jun-2005Tribocorrosion behaviour of zrNxOy thin films for decorative applicationsFerreira, S. C.; Ariza, E.; Rocha, L. A.; Vaz, F.; Cunha, L.; Carvalho, P.; Rebouta, L.; Alves, E.; Goudeau, Ph.; Rivière, J. P.AbstractOpen access