Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/20143
Título: | Nanomorphology control of thin P3HT/Si-NCs composite films for hybrid photovoltaic cells |
Autor(es): | Cunha, Mara Bernardo, Gabriel Hilliou, L. Wiggers, H. Pereira, Ricardo |
Palavras-chave: | Photovoltaics Nanocomposites Hybrid solar cell Poly(3-hexylthiophene) Film morphology Spin coating |
Data: | 18-Abr-2011 |
Resumo(s): | Polymer-based photovoltaic devices can be fabricated easily over large areas using simple inkjet-printing or roll-to-roll techniques, making them very attractive for the inexpensive large scale fabrication of sustainable energy production devices. Previous studies on the bulk-heterojunction system of poly(3-hexylthiophene) (P3HT), as electron donor, and the fullerene derivative [6,6]-phenyl-C61-butyric acid methyl ester (PCBM), as an electron acceptor, have shown that the final device efficiency is highly dependent on the thin film morphology, which is the result of the processing conditions [1]. Gas-phase grown freestanding silicon nanocrystals (Si-NCs) have been introduced as a new electron acceptor to potentially replace PCBM [2]. One clear advantage of Si-NCs over PCBM is that their size-dependent behavior adds functionality to solar cells, such as a tunable absorption spectrum [3]. Systematic studies on the effect of processing conditions on the final morphology of P3HT/Si-NCs thin films are still lacking in the literature. Here, we show how the final morphology of thin spin-casted nanocomposite films of P3HT and Si-NCs is affected by processing parameters such as the solvent quality, the film forming viscosity, and the spinning rate. Six different solutions with P3HT and Si-NCs in the weight proportion 1:1 and different total solid contents have been prepared with chloroform, dichlorobenzene, and dioctyl phthalate (DOP). Thin films (100nm thick) have been spin-casted from these solutions onto glass substrates, using different spinning rates, and resulting films were annealed under vacuum at 150 ºC for 20 minutes. The films surface topography was assessed by atomic force microscopy and scanning electron microscopy. X‐ray diffraction methods were used to characterize the degree of crystallinity and orientation of crystalline domains within the thin films. The absorption spectrum of the different films has also been measured using UV-Vis spectroscopy. Our results show clear evidence for the important influence of the film processing conditions on the final P3HT/Si-NCs film morphologies. |
Tipo: | Resumo em ata de conferência |
URI: | https://hdl.handle.net/1822/20143 |
Arbitragem científica: | yes |
Acesso: | Acesso restrito UMinho |
Aparece nas coleções: | IPC - Resumos em actas de encontros científicos internacionais com arbitragem |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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mat2011 abstract uploaded.pdf Acesso restrito! | abstract poster presentation | 163,42 kB | Adobe PDF | Ver/Abrir |