Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/2583

TítuloDetermination and modeling of yeast viability under stress conditions
Autor(es)Coutinho, J. A. P.
Coelho, M. A. Z.
Ferreira, Eugénio C.
Belo, Isabel
Palavras-chaveModeling
Digital image processing
Cell viability
Yeast
Data2004
EditoraElsevier
CitaçãoCOUTINHO, João A. P. [et al] - Determination and modeling of yeast viability under stress conditions. In ESCAPE : european symposium on computer-aided process engineering, 14, Lisbon, 2004 ; European symposium of the working party on computer-aided process engineering, 37, Lisbon, 2004 – “ESCAPE-14 : European Symposium on Computer Aided Process Engineering ; 37th European symposium of the working party on computer-aided process engineering” [CD-ROM]. Amsterdam [etc.] : Elsevier, 2004. ISBN 0-444-51694-8. ISSN 1570-7946.
Resumo(s)In this work the effect of the total pressure and the oxygen concentration in the gas phase on the growth and viability of Saccharomyces cerevisiae is studied. Cell viability was measured staining with methylene blue and assessed using digital image processing. A model that takes into account cell viability was developed and used for the correlation of the measured data. A dependence of the death rate, KD, with the total pressure and the oxygen concentration is proposed. Its behavior indicates that opposing effects between oxygen availability and baric and oxidative stresses are present on the system. It is shown that the proposed model can, with this extra parameter, successfully describe not only the traditional X-P-S evolution but also the ratio of viable cells with time.
TipoArtigo em ata de conferência
URIhttps://hdl.handle.net/1822/2583
ISBN0-444-51694-8
ISSN1570-7946
Versão da editorahttp://www.elsevier.com/wps/find/homepage.cws_home
Arbitragem científicayes
AcessoAcesso aberto
Aparece nas coleções:CEB - Artigos em Livros de Atas / Papers in Proceedings

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