Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/27450
Título: | Multi-dimensional modelling of electrostatic forces between atomic force microscopy tip and dielectric surface |
Autor(es): | Boularas, A. Baudouin, F. Teyssedre, Gilles Villeneuve-Faure, C. Clain, Stéphane |
Palavras-chave: | Dielectric Modeling Finite volume Microscopy AFM electrostatic force finite volume method (FVM) Polynomial reconstruction operator (PRO) dielectric material |
Data: | 2013 |
Editora: | IEEE |
Revista: | Ieee International Conference on Solid Dielectrics-Icsd |
Resumo(s): | In this paper, simulation results for the electrostatic force between an Atomic Force Microscope (AFM) sensor and the surface of a dielectric are presented for different bias voltages on the tip:. The aim is to analyse force-distance curves as AFM detection mode for electrostatic charges. The sensor is composed of a cantilever supporting a conical tip terminated by a spherical apex; the effect of the cantilever is neglected here. Our model of force curve has been developed using the Finite Volume Method. The scheme is based on the Polynomial Reconstruction Operator – PRO-scheme. First results of the computation of electrostatic force for different tip– sample distances, 0 to 600 nm, and for different DC voltage stress applied to the tip, 6 to 25 V, are shown and compared with experimental data in order to validate our approach. |
Tipo: | Artigo em ata de conferência |
URI: | https://hdl.handle.net/1822/27450 |
ISBN: | 9781479908073 |
DOI: | 10.1109/ICSD.2013.6619876 |
ISSN: | 1553-5282 |
Versão da editora: | http://ieeexplore.ieee.org/Xplore/home.jsp |
Arbitragem científica: | yes |
Acesso: | Acesso restrito UMinho |
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Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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ICSD_Boularas_IEEE.pdf Acesso restrito! | documento principal | 603,17 kB | Adobe PDF | Ver/Abrir |