Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/3435

TítuloThe effect of the STM tip on Si(100) reconstructed surfaces
Autor(es)Ramos, Marta M. D.
Stoneham, A. M.
Sutton, A. P.
Palavras-chaveScanning tunneling microscopy
CNDO method
Si(001)
Defects
Energy
DataMai-1993
EditoraIOP Publishing
RevistaJournal of Physics Condensed Matter
Citação"Journal of Physics Condensed Matter". ISSN 2849-2858. 5:18 (1993) 2849-2858.
Resumo(s)We present a theoretical study of the effects of the STM tip on the geometry of Si(100) reconstructed surfaces. The energy barrier to switching between different reconstructions is also discussed. We use a molecular dynamics method and self-consistent forces to simulate the time-dependent behaviour of the surface atoms. The molecular orbital calculations are performed at the CNDO level using a cluster model. Our results indicate significant differences for positively and negatively biased tips. The thermally induced rocking of surface dimers is inhibited by the application of a positive bias to the tip and it is promoted by a negative bias. These bias-dependent effects may offer a plausible explanation for the bias dependence of STM images of this surface.
TipoArtigo
URIhttps://hdl.handle.net/1822/3435
ISSN0953-8984
Versão da editorahttp://www.iop.org
Arbitragem científicayes
AcessoAcesso aberto
Aparece nas coleções:CDF - FCT - Artigos/Papers (with refereeing)

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