Please use this identifier to cite or link to this item:
https://hdl.handle.net/1822/61340
Title: | Strain dependence electrical resistance and cohesive strength of ITO thin films deposited on electroactive polymer |
Author(s): | Rebouta, L. Rubio-Peña, L. Oliveira, C. Lanceros-Méndez, S. Tavares, C. J. Alves, E. |
Keywords: | Tensile test ITO Cohesive strength Crack onset strain Electroactive polymers |
Issue date: | 1-Jun-2010 |
Publisher: | Elsevier Science SA |
Journal: | Thin Solid Films |
Abstract(s): | Transparent, conducting, indium tin oxide (ITO) films have been deposited, by pulsed dc magnetron sputtering, on glass and electroactive polymer (poly(vinylidene fluoride)-PVDF) substrates. Samples have been prepared at room temperature by varying the oxygen partial pressure. Electrical resistivity around 8.4 x 10(-4) Omega cm has been obtained for films deposited on glass, while a resistivity of 1.7 x 10(-3) Omega cm has been attained in similar coatings on PVDF. Fragmentation tests were performed on PVDF substrates with thicknesses of 28 mu m and 110 mu m coated with 40 nm ITO layer. The coating's fragmentation process was analyzed and the crack onset strain and cohesive strength of ITO layers were evaluated. |
Type: | Article |
URI: | https://hdl.handle.net/1822/61340 |
DOI: | 10.1016/j.tsf.2009.12.022 |
ISSN: | 0040-6090 |
Peer-Reviewed: | yes |
Access: | Open access |
Appears in Collections: | CDF - GRF - Artigos/Papers (with refereeing) |
Files in This Item:
File | Description | Size | Format | |
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TSF_518_2010_4525–4528_Strain dependence electrical resistance and cohesive strength of ITO thin films deposited on electroactive polymer.pdf | 768,19 kB | Adobe PDF | View/Open |