Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/1590
Registo completo
Campo DC | Valor | Idioma |
---|---|---|
dc.contributor.author | Teodoro, O. M. N. D. | - |
dc.contributor.author | Barbosa, J. | - |
dc.contributor.author | Naia, M. Duarte | - |
dc.contributor.author | Moutinho, A. M. C. | - |
dc.date.accessioned | 2005-05-16T10:25:35Z | - |
dc.date.available | 2005-05-16T10:25:35Z | - |
dc.date.issued | 2004 | - |
dc.identifier.citation | "Applied surface science". ISSN 0169-4332. 231-232 (2004) 854-858. | eng |
dc.identifier.issn | 0169-4332 | - |
dc.identifier.uri | https://hdl.handle.net/1822/1590 | - |
dc.description.abstract | Titanium aluminides are a valuable alternative to superalloys in applications where the ratio resistance/density is important. Since the ordinary production routes lead to high final costs, an alternative might be the use of traditional casting techniques by induction melting of the alloy in a ceramic crucible and pouring into ceramic moulds, made by the investment casting process. However, due to the high reactivity of Ti alloys, traditional ceramic materials cannot be used, as they lead to oxide formation and oxygen pick up from both the crucible and the moulding materials. In this work, the effect of low level contaminations was studied by SIMS. Special attention was given to the oxygen concentration of samples obtained with different mould materials. The comparison of SIMS in-depth profiles with hardness profiles, give insight concerning the significance of the oxygen concentration in the properties of the alloy and regarding the choice of the most suitable materials for TiAl production. | eng |
dc.language.iso | eng | eng |
dc.publisher | Elsevier 1 | eng |
dc.rights | openAccess | eng |
dc.subject | Titanium | eng |
dc.subject | Contamination | eng |
dc.subject | SIMS | eng |
dc.subject | Casting techniques | eng |
dc.subject | Oxygen contamination | eng |
dc.subject | TiAl | por |
dc.subject | alloys | por |
dc.title | Effect of low level contamination on TiAl alloys studied by SIMS | eng |
dc.type | article | eng |
dc.peerreviewed | yes | eng |
oaire.citationStartPage | 854 | por |
oaire.citationEndPage | 858 | por |
oaire.citationVolume | 231 | por |
dc.identifier.doi | 10.1016/j.apsusc.2004.03.142 | por |
dc.subject.wos | Science & Technology | por |
sdum.journal | Applied Surface Science | por |
Aparece nas coleções: | DEM - Artigos em revistas de circulação internacional com arbitragem científica |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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SIMSUSA.pdf | 272,5 kB | Adobe PDF | Ver/Abrir |