Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/4139

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dc.contributor.authorCorreia, J. H.-
dc.contributor.authorBartek, M.-
dc.contributor.authorWolffenbuttel, R. F.-
dc.date.accessioned2006-01-20T17:54:14Z-
dc.date.available2006-01-20T17:54:14Z-
dc.date.issued2000-03-
dc.identifier.citation"IEEE Transactions on Electron Devices". ISSN 0018-9383. 47:3 (Mar. 2000) 553-559.eng
dc.identifier.issn0018-9383por
dc.identifier.urihttps://hdl.handle.net/1822/4139-
dc.description.abstractA microspectrometer has been realized based on an array of Fabry–Perot optical thin-film filters. The 16-channel microspectrometer is compatible with IC fabrication methods and operates in the visible spectral range with an interchannel shift of 6 nm. Each of the channels is sensitive in a single peak with full-width-half-maximum (FWHM) of 16 nm. Also aFWHMbelow 2 nm and finesse of 40 for narrow band operation is demonstrated. The device can easily be tuned during fabrication to cover a different spectral band only by adjusting the etching times without affecting the device layout. Such a device is extremely suitable for applications in microsystems because of its small size, high spectral selectivity, and low cost. Microspectrometers for the UV and IR regions are also feasible using this technique.eng
dc.description.sponsorshipFundação para a Ciência e a Tecnologia (FCT)por
dc.language.isoengeng
dc.publisherIEEEeng
dc.rightsopenAccesseng
dc.subjectArray-type microspectrometereng
dc.subjectFabry–Perot etaloneng
dc.subjectOptical filtereng
dc.subjectVisible light detectoreng
dc.subjectfinessepor
dc.subjectFWHMpor
dc.titleHigh-selectivity single-chip spectrometer in silicon for operation at visible part of the spectrumeng
dc.typearticlepor
dc.peerreviewedyeseng
sdum.number3eng
sdum.pagination553-559eng
sdum.publicationstatuspublishedeng
sdum.volume47eng
oaire.citationStartPage553por
oaire.citationEndPage559por
oaire.citationIssue3por
oaire.citationVolume47por
dc.identifier.doi10.1109/16.824727por
dc.subject.wosScience & Technologypor
sdum.journalIEEE Transactions on Electron Devicespor
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