Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/4139
Registo completo
Campo DC | Valor | Idioma |
---|---|---|
dc.contributor.author | Correia, J. H. | - |
dc.contributor.author | Bartek, M. | - |
dc.contributor.author | Wolffenbuttel, R. F. | - |
dc.date.accessioned | 2006-01-20T17:54:14Z | - |
dc.date.available | 2006-01-20T17:54:14Z | - |
dc.date.issued | 2000-03 | - |
dc.identifier.citation | "IEEE Transactions on Electron Devices". ISSN 0018-9383. 47:3 (Mar. 2000) 553-559. | eng |
dc.identifier.issn | 0018-9383 | por |
dc.identifier.uri | https://hdl.handle.net/1822/4139 | - |
dc.description.abstract | A microspectrometer has been realized based on an array of Fabry–Perot optical thin-film filters. The 16-channel microspectrometer is compatible with IC fabrication methods and operates in the visible spectral range with an interchannel shift of 6 nm. Each of the channels is sensitive in a single peak with full-width-half-maximum (FWHM) of 16 nm. Also aFWHMbelow 2 nm and finesse of 40 for narrow band operation is demonstrated. The device can easily be tuned during fabrication to cover a different spectral band only by adjusting the etching times without affecting the device layout. Such a device is extremely suitable for applications in microsystems because of its small size, high spectral selectivity, and low cost. Microspectrometers for the UV and IR regions are also feasible using this technique. | eng |
dc.description.sponsorship | Fundação para a Ciência e a Tecnologia (FCT) | por |
dc.language.iso | eng | eng |
dc.publisher | IEEE | eng |
dc.rights | openAccess | eng |
dc.subject | Array-type microspectrometer | eng |
dc.subject | Fabry–Perot etalon | eng |
dc.subject | Optical filter | eng |
dc.subject | Visible light detector | eng |
dc.subject | finesse | por |
dc.subject | FWHM | por |
dc.title | High-selectivity single-chip spectrometer in silicon for operation at visible part of the spectrum | eng |
dc.type | article | por |
dc.peerreviewed | yes | eng |
sdum.number | 3 | eng |
sdum.pagination | 553-559 | eng |
sdum.publicationstatus | published | eng |
sdum.volume | 47 | eng |
oaire.citationStartPage | 553 | por |
oaire.citationEndPage | 559 | por |
oaire.citationIssue | 3 | por |
oaire.citationVolume | 47 | por |
dc.identifier.doi | 10.1109/16.824727 | por |
dc.subject.wos | Science & Technology | por |
sdum.journal | IEEE Transactions on Electron Devices | por |
Aparece nas coleções: | DEI - Artigos em revistas internacionais |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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artigo1.pdf | Documento principal | 1,07 MB | Adobe PDF | Ver/Abrir |