Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/89750

TítuloDistributed optical fiber sensors for PCB-strain analysis
Autor(es)Gomes, José Miguel Sousa
Cruz, Sílvia Manuela Ferreira
Lopes, Henrique
Arcipreste, Bruno
Magalhães, Roberto
Ferreira da Silva, Alexandre
Viana, J. C.
Palavras-chaveOptical fiber technology
Optical frequency domain reflectometry (OFDR)
PCB-strain
Strain gauges
DataOut-2019
EditoraIEEE
RevistaIEEE Transactions on Industrial Electronics
CitaçãoM. Gomes et al., "Distributed Optical Fiber Sensors for PCB-Strain Analysis," in IEEE Transactions on Industrial Electronics, vol. 66, no. 10, pp. 8181-8188, Oct. 2019, doi: 10.1109/TIE.2018.2885686.
Resumo(s)Printed circuit board (PCB)-strain tests are part of the quality control processes to detect and identify predamages on manufactured products. Such tests are commonly performed by instrumenting a PCB, and subjecting it to the manufacturing conditions. Among the various parameters to evaluate on the production equipment, the induced strain on the PCB is one of them, enabling the assessment of the manufacturing equipment performance. PCB instrumentation with foil strain gauges is currently highly complex due to small size and over populated boards, limiting the overall number of monitoring points. This paper aims at outlining an alternative approach based on distributed optical fiber technology sensors. To prove its feasibility, optical fiber sensors based on optical frequency domain reflectometry are considered and benchmarked against conventional foil strain gauges. A PCB was instrumented with both sensor technologies and subjected to an in-circuit test machine. The strain results showed a match between both technologies, with a maximum deviation of 3.5%, a high precision level for multiple tests, and a high sensitivity for both high and low induced strains. Overall, the fiber optic solution proved to be a suitable alternative technology for foil strain gauges in PCB-strain measurement application.
TipoArtigo
URIhttps://hdl.handle.net/1822/89750
DOI10.1109/TIE.2018.2885686
ISSN0278-0046
e-ISSN1557-9948
Versão da editorahttps://ieeexplore.ieee.org/document/8575123
Arbitragem científicayes
AcessoAcesso restrito UMinho
Aparece nas coleções:IPC - Artigos em revistas científicas internacionais com arbitragem

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