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https://hdl.handle.net/1822/13772
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Campo DC | Valor | Idioma |
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dc.contributor.author | Cerqueira, M. F. | - |
dc.contributor.author | Losurdo, M. | - |
dc.contributor.author | Monteiro, T. | - |
dc.contributor.author | Stepikhova, M. | - |
dc.contributor.author | Soares, Manuel Jorge | - |
dc.contributor.author | Peres, M. | - |
dc.contributor.author | Alpuim, P. | - |
dc.date.accessioned | 2011-10-04T17:06:25Z | - |
dc.date.available | 2011-10-04T17:06:25Z | - |
dc.date.issued | 2007 | - |
dc.identifier.issn | 1862-6300 | por |
dc.identifier.uri | https://hdl.handle.net/1822/13772 | - |
dc.description.abstract | Erbium-doped low-dimensional Si films with different microstructures were deposited by reactive magnetron sputtering on glass substrates by varying the hydrogen flow rate during deposition. Amorphous, micro- and nanocrystalline samples, consisting of Si nanocrystalls embedded in silicon-based matrices with different structures, were achieved with optical properties in the visible and IR depending on nanocrystalline fraction and matrix structure and chemical composition. Structural characterization was performed by X-ray diffraction in the grazing incidence geometry and Raman spectroscopy. The chemical composition was studied using RBS/ERD techniques. Spectroscopic ellipsometry was combined with the previous techniques to further re-solve the film microstructure and composition. In particular, the distribution along the film thickness of the volume fractions of nanocrystalline/amorphous silicon and SiOx phases has been obtained. In this contribution we discuss visible and infrared photoluminescence as a function of sample microstructure and of the oxygen/ hydrogen concentration ratio present in the matrix. | por |
dc.description.sponsorship | FCT (POCTI/CTM/39395) | por |
dc.description.sponsorship | INTAS Project #03-51-6486 | por |
dc.language.iso | eng | por |
dc.publisher | Wiley-VCH Verlag | por |
dc.rights | openAccess | por |
dc.subject | Erbium-doped | por |
dc.subject | Low-dimensional Si films | por |
dc.subject | Optical properties | por |
dc.subject | Spectroscopic ellipsometry | por |
dc.title | Visible and infrared photoluminescence from erbium-doped silicon nanocrystals produced by rf sputtering | por |
dc.type | article | por |
dc.peerreviewed | yes | por |
dc.relation.publisherversion | http://onlinelibrary.wiley.com/doi/10.1002/pssa.200675350/pdf | por |
sdum.publicationstatus | published | por |
oaire.citationStartPage | 1769 | por |
oaire.citationEndPage | 1774 | por |
oaire.citationIssue | 6 | por |
oaire.citationTitle | Physica Status Solidi A | por |
oaire.citationVolume | 204 | por |
dc.identifier.doi | 10.1002/pssa.200675350 | por |
dc.subject.wos | Science & Technology | por |
sdum.journal | physica status solidi (a) | por |
Aparece nas coleções: | CDF - FMNC - Artigos/Papers (with refereeing) |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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VisIRPL-SiEr-PSSa-2007.pdf | Documento principal | 437,5 kB | Adobe PDF | Ver/Abrir |