Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/24612

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dc.contributor.authorRodrigues, J. N. B.-
dc.contributor.authorPeres, N. M. R.-
dc.contributor.authorSantos, J. M. B. Lopes dos-
dc.date.accessioned2013-07-09T17:31:59Z-
dc.date.available2013-07-09T17:31:59Z-
dc.date.issued2013-07-09-
dc.identifier.citationJ. Phys.: Condens. Matter 25 (2013) 075303por
dc.identifier.issn0953-8984por
dc.identifier.urihttps://hdl.handle.net/1822/24612-
dc.description.abstractWe develop an analytical scattering formalism for computing the transmittance through periodic defect lines within the tight-binding model of graphene. We first illustrate the method with a relatively simple case, the pentagon-only defect line. Afterwards, more complex defect lines are treated, namely the zz(558) and the zz(5757) ones. The formalism developed, only uses simple tight-binding concepts, reducing the problem to matrix manipulations which can be easily worked out by any computational algebraic calculator.por
dc.description.sponsorshipJNBR was supported by Fundacao para a Ciencia e a Tecnologia (FCT) through Grant No. SFRH/BD/44456/2008. NMRP was supported by Fundos FEDER through the Programa Operacional Factores de Competitividade-COMPETE and by FCT under project no. PEst-C/FIS/UI0607/2011. NMRP acknowledges both the hospitality and the funding from the Graphene Research Centre at the National University of Singapore, where this work was completed.por
dc.language.isoengpor
dc.publisherIOP Publishing-
dc.rightsopenAccesspor
dc.subjectGraphenepor
dc.subjectTransportpor
dc.titleScattering by linear defects in graphene: a tight-binding approachpor
dc.typearticlepor
dc.peerreviewedyespor
sdum.publicationstatuspublishedpor
oaire.citationIssue7por
oaire.citationVolume25por
dc.identifier.doi10.1088/0953-8984/25/7/075303por
dc.identifier.pmid23341433por
dc.subject.wosScience & Technologypor
sdum.journalJournal of Physics Condensed Matterpor
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