On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt-Si and its effect on the electrical properties

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On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt-Si and its effect on the electrical properties

Autor(es)

Silva, J. P. B.

Sekhar, K. C. Rodrigues, S. A. S. Pereira, Mário R.

Parisini, A. Alves, E. Barradas, N. P. Gomes, M. J. M.

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On the formation of an interface amorphous layer in nanostructured ferroelectric.pdf (810.89 KB)

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CDF - FMNC - Artigos | Articles (with refereeing)

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