Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/37990

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dc.contributor.authorAbreu, Ruipor
dc.contributor.authorVan Gemund, Arjan JCpor
dc.contributor.authorZoeteweij, Peterpor
dc.date.accessioned2015-11-05T11:51:58Z-
dc.date.available2015-11-05T11:51:58Z-
dc.date.issued2007-
dc.identifier.urihttps://hdl.handle.net/1822/37990-
dc.description.abstractSpectrum-based fault localization shortens the test- diagnose-repair cycle by reducing the debugging effort. As a light-weight automated diagnosis technique it can easily be integrated with existing testing schemes. However, as no model of the system is taken into account, its diagnostic accuracy is inherently limited. Using the Siemens Set benchmark, we investigate this diagnostic accuracy as a function of several parameters (such as quality and quantity of the program spectra collected during the execution of the system), some of which directly relate to test design. Our results indicate that the superior performance of a particular similarity coefficient, used to analyze the program spectra, is largely independent of test design. Furthermore, near- optimal diagnostic accuracy (exonerating about 80% of the blocks of code on average) is already obtained for low-quality error observations and limited numbers of test cases. The influence of the number of test cases is of primary importance for continuous (embedded) processing applications, where only limited observation horizons can be maintained.por
dc.language.isoengpor
dc.rightsopenAccesspor
dc.subjectTest data analysispor
dc.subjectSoftware fault diagnosispor
dc.subjectProgram spectrapor
dc.titleOn the accuracy of spectrum-based fault localizationpor
dc.typeconferencePaperpor
dc.peerreviewedyespor
dc.comments1750por
sdum.publicationstatuspublishedpor
oaire.citationStartPage89por
oaire.citationEndPage98por
oaire.citationTitleTesting: Academic and Industrial Conference Practice and Research Techniques : MUTATION, 2007. TAICPART-MUTATION 2007por
dc.publisher.uriIEEEpor
sdum.conferencePublicationTesting: Academic and Industrial Conference Practice and Research Techniques : MUTATION, 2007. TAICPART-MUTATION 2007por
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