Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/38013
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Campo DC | Valor | Idioma |
---|---|---|
dc.contributor.author | Zoeteweij, Peter | por |
dc.contributor.author | Abreu, Rui | por |
dc.contributor.author | Golsteijn, Rob | por |
dc.contributor.author | Van Gemund, Arjan JC | por |
dc.date.accessioned | 2015-11-05T17:47:42Z | - |
dc.date.available | 2015-11-05T17:47:42Z | - |
dc.date.issued | 2007 | - |
dc.identifier.uri | https://hdl.handle.net/1822/38013 | - |
dc.description.abstract | Automated diagnosis of errors detected during software testing can improve the efficiency of the debugging process, and can thus help to make software more reliable. In this paper we discuss the application of a specific automated debugging technique, namely software fault localization through the analysis of program spectra, in the area of embedded software in high-volume consumer electronics products. We discuss why the technique is particularly well suited for this application domain, and through experiments on an industrial test case we demonstrate that it can lead to highly accurate diagnoses of realistic errors. | por |
dc.language.iso | eng | por |
dc.rights | openAccess | por |
dc.subject | Diagnosis | por |
dc.subject | Program spectra | por |
dc.subject | Automated debugging | por |
dc.subject | Embedded systems | por |
dc.subject | Consumer electronics. | por |
dc.title | Diagnosis of embedded software using program spectra | por |
dc.type | conferencePaper | por |
dc.peerreviewed | yes | por |
dc.comments | 1755 | por |
sdum.publicationstatus | published | por |
dc.publisher.uri | IEEE | por |
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