Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/39781

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dc.contributor.authorVieira, E. M. F.por
dc.contributor.authorRibeiro, J. F.por
dc.contributor.authorSousa, Rpor
dc.contributor.authorSilva, Maria Manuelapor
dc.contributor.authorDupont, L.por
dc.contributor.authorGoncalves, L. M.por
dc.date.accessioned2016-01-29T14:19:42Z-
dc.date.issued2016-
dc.identifier.citationVieira, E. M. F., Ribeiro, J. F., Sousa, R., Silva, M. M., Dupont, L., & Goncalves, L. M. (2016). Titanium Oxide Adhesion Layer for High Temperature Annealed Si/Si3N4/TiOx/Pt/LiCoO2 Battery Structures. Journal of Electronic Materials, 45(2), 910-916. doi: 10.1007/s11664-015-4223-5por
dc.identifier.issn0361-5235por
dc.identifier.issn1543-186Xpor
dc.identifier.urihttps://hdl.handle.net/1822/39781-
dc.description.abstractThis work describes the influence of a high annealing temperature of about 700C on the Si(substrate)/Si3N4/TiOx/Pt/LiCoO2 multilayer system for the fabrication of all-solid-state lithium ion thin film microbatteries. Such microbatteries typically utilize lithium cobalt oxide (LiCoO2) as cathode material with a platinum (Pt) current collector. Silicon nitride (Si3N4) is used to act as a barrier against Li diffusion into the substrate. For a good adherence between Si3N4 and Pt, commonly titanium (Ti) is used as intermediate layer. However, to achieve crystalline LiCoO2 the multilayer system has to be annealed at high temperature. This post-treatment initiates Ti diffusion into the Pt-collector and an oxidation to TiOx, leading to volume expansion and adhesion failures. To solve this adhesion problem, we introduce titanium oxide (TiOx) as an adhesion layer, avoiding the diffusion during the annealing process. LiCoO2, Pt and Si3N4 layers were deposited by magnetron sputtering and the TiOx layer by thermal oxidation of Ti layers deposited by e-beam technique. Asdeposited and annealed multilayer systems using various TiOx layer thicknesses were studied by scanning electron microscopy (SEM) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) and x-ray photoelectron spectroscopy (XPS). The results revealed that an annealing process at temperature of 700C leads to different interactions of Ti atoms between the layers, for various TiOx layer thicknesses (25–45 nm).por
dc.description.sponsorshipThis work was financially supported by FEDER/ COMPETE and FCT funds with the Projects PTDC/ EEA-ELC/114713/2009, PEst-C/QUI/UI0686/2013 and UID/EEA/04436/2013, first author scholarship SFRH/BPD/95905/2013 and second author scholarship SFRH/BD/78217/2011. This work was carried out with the support of the Karlsruhe Nano Micro Facility (KNMF, www.kit.edu/knmf), a Helmholtz Research Infrastructure at Karlsruhe Institute of Technology (KIT, www.kit.edu).por
dc.language.isoengpor
dc.publisherIEEEpor
dc.relationinfo:eu-repo/grantAgreement/FCT/5876-PPCDTI/114713/PTpor
dc.relationinfo:eu-repo/grantAgreement/FCT/COMPETE/132953/PTpor
dc.relationinfo:eu-repo/grantAgreement/FCT/5876/147325/PTpor
dc.relationinfo:eu-repo/grantAgreement/FCT/SFRH/SFRH%2FBPD%2F95905%2F2013/PTpor
dc.relationinfo:eu-repo/grantAgreement/FCT/SFRH/SFRH%2FBD%2F78217%2F2011/PTpor
dc.rightsrestrictedAccesspor
dc.subjectLi-microbatteriespor
dc.subjectplatinumpor
dc.subjecttitanium oxidepor
dc.subjectadhesion layerpor
dc.subjecthigh temperaturepor
dc.subjectTOF-SIMSpor
dc.titleTitanium oxide adhesion layer for high temperature annealed Si/Si3N4/TiOx/Pt/LiCoO2 battery structurespor
dc.typearticlepor
dc.peerreviewedyespor
sdum.publicationstatuspublishedpor
oaire.citationStartPage910por
oaire.citationEndPage916por
oaire.citationIssue2por
oaire.citationTitleJournal of Electronic Materialspor
oaire.citationVolume45por
dc.identifier.doi10.1007/s11664-015-4223-5por
dc.subject.fosCiências Naturais::Ciências Químicaspor
dc.subject.wosScience & Technologypor
sdum.journalJournal of Electronic Materialspor
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CDQuim - Artigos (Papers)
DEI - Artigos em revistas internacionais

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