Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/71129

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dc.contributor.authorMachado, Ruipor
dc.contributor.authorAlves, Filipe Manuel Serrapor
dc.contributor.authorGeraldes, Álvaropor
dc.contributor.authorCabral, Jorgepor
dc.date.accessioned2021-03-31T00:52:34Z-
dc.date.available2021-03-31T00:52:34Z-
dc.date.issued2020-
dc.identifier.citationR. Machado, F. S. Alves, Á. Geraldes and J. Cabral, "Technology Independent ASIC Based Time to Digital Converter," in IEEE Access, vol. 8, pp. 195820-195831, 2020, doi: 10.1109/ACCESS.2020.3034522.por
dc.identifier.issn2169-3536-
dc.identifier.urihttps://hdl.handle.net/1822/71129-
dc.description.abstractThis paper proposes a design methodology for a synthesizable, fully digital TDC architecture. The TDC was implemented using a hardware description language (HDL), which improves portability between platforms and technologies and significantly reduces design time. The proposed design flow is fully automated using TCL scripting and standard CAD tools configuration files. The TDC is based on a Tapped Delay Line architecture and explores the use of Structured Data Path (SDP) as a way to improve the TDL linearity by homogenizing the routing and parasitic capacitances across the multiple TDL’s steps. The studied approach also secures a stable, temperature independent measurement operation. The proposed TDC architecture was fabricated using TSMC 180nm CMOS process technology, with a 50MHz reference clock and a supply voltage of 1.8V. The fabricated TDC achieved an 111ps RMS resolution and a single-shot precision of 54ps (0.48 LSB) and 279ps (2.51 LSB), with and without post-measurement software calibration, respectively. The DNL across the channel is mostly under 0.3 LSB and a maximum of 8 LSB peak-to-peak INL was achieved, when no calibration is applied.por
dc.description.sponsorship- (037902)por
dc.language.isoengpor
dc.publisherIEEEpor
dc.rightsopenAccesspor
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/por
dc.subjectApplication specific integrated circuit (ASIC)por
dc.subjectStructured data path (SDP)por
dc.subjectTime interval measurementpor
dc.subjectTime-to-digital converter (TDC)por
dc.subjectClockspor
dc.subjectRegisterspor
dc.subjectApplication specific integrated circuitspor
dc.subjectField programmable gate arrayspor
dc.subjectDecodingpor
dc.subjectThermometerspor
dc.titleTechnology independent ASIC based time to digital converterpor
dc.typearticlepor
dc.peerreviewedyespor
dc.relation.publisherversionhttps://ieeexplore.ieee.org/document/9241845por
oaire.citationStartPage195820por
oaire.citationEndPage195831por
oaire.citationVolume8por
dc.date.updated2021-03-30T23:20:39Z-
dc.identifier.doi10.1109/ACCESS.2020.3034522por
dc.subject.fosCiências Agrárias::Ciência Animal e dos Laticíniospor
dc.subject.fosCiências Agrárias::Ciências Veterináriaspor
dc.subject.fosCiências Agrárias::Biotecnologia Agrária e Alimentarpor
dc.subject.wosScience & Technology-
sdum.export.identifier10213-
sdum.journalIEEE Accesspor
oaire.versionVoRpor
Aparece nas coleções:CAlg - Artigos em revistas internacionais / Papers in international journals

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Este trabalho está licenciado sob uma Licença Creative Commons Creative Commons

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