Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/81157

TítuloComputer simulations of silicide-tetrahedrite thermoelectric generators
Autor(es)Coelho, Rodrigo
Casi, Álvaro
Araiz, Miguel
Astrain, David
Lopes, Elsa Branco
Brito, Francisco Pinto Santos
Gonçalves, António P.
Palavras-chaveThermoelectric devices
Silicide-tetrahedrite modules
Computer simulations
Finite element method
Implicit differential method
Tetrahedrites
Magnesium silicides
Data5-Nov-2022
EditoraMultidisciplinary Digital Publishing Institute (MDPI)
RevistaMicromachines
CitaçãoCoelho, R.; Casi, Á.; Araiz, M.; Astrain, D.; Branco Lopes, E.; Brito, F.P.; Gonçalves, A.P. Computer Simulations of Silicide-Tetrahedrite Thermoelectric Generators. Micromachines 2022, 13, 1915. https://doi.org/10.3390/mi13111915
Resumo(s)With global warming and rising energy demands, it is important now than ever to transit to renewable energy systems. Thermoelectric (TE) devices can present a feasible alternative to generate clean energy from waste heat. However, to become attractive for large-scale applications, such devices must be cheap, efficient, and based on ecofriendly materials. In this study, the potential of novel silicide-tetrahedrite modules for energy generation was examined. Computer simulations based on the finite element method (FEM) and implicit finite difference method (IFDM) were performed. The developed computational models were validated against data measured on a customized system working with commercial TE devices. The models were capable of predicting the TEGs’ behavior with low deviations (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mo>≤</mo></mrow></semantics></math></inline-formula>10%). IFDM was used to study the power produced by the silicide-tetrahedrite TEGs for different <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mo>Δ</mo><mi>T</mi></mrow></semantics></math></inline-formula> between the sinks, whereas FEM was used to study the temperature distributions across the testing system in detail. To complement these results, the influence of the electrical and thermal contact resistances was evaluated. High thermal resistances were found to affect the devices <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mo>Δ</mo><mi>T</mi></mrow></semantics></math></inline-formula> up to ~15%, whereas high electrical contact resistances reduced the power output of the silicide-tetrahedrite TEGs by more than ~85%.
TipoArtigo
URIhttps://hdl.handle.net/1822/81157
DOI10.3390/mi13111915
e-ISSN2072-666X
Versão da editorahttps://www.mdpi.com/2072-666X/13/11/1915
Arbitragem científicayes
AcessoAcesso aberto
Aparece nas coleções:BUM - MDPI

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Este trabalho está licenciado sob uma Licença Creative Commons Creative Commons

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