Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/8629

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Campo DCValorIdioma
dc.contributor.authorVelhinho, A.-
dc.contributor.authorFernandes, F. M. Braz-
dc.contributor.authorFerreira, S. C.-
dc.contributor.authorRocha, L. A.-
dc.contributor.authorVignoles, G.-
dc.contributor.authorCloetens, P.-
dc.date.accessioned2009-01-19T17:59:41Z-
dc.date.available2009-01-19T17:59:41Z-
dc.date.issued2006-
dc.identifier.citation"Advances in Science and Technology". ISSN 1662-8969. 45 (2006) 1109-1116.en
dc.identifier.issn1662-8969en
dc.identifier.urihttps://hdl.handle.net/1822/8629-
dc.description.abstractThis paper provides a brief overview of the possibilities offered by X-ray computed microtomography, and particularly synchrotron radiation X-ray microtomography, regarding metal matrix composite characterization, emphasis being placed in the case of Al-based functionally graded materials. Examples are provided concerning the characterization of the reinforcement population, interfacial properties, in-situ transformation and damage evolution. The specific needs of the technique and limitations to its widespread use are mentioned.en
dc.language.isoengen
dc.publisherTrans Tech Publicationsen
dc.rightsopenAccessen
dc.subjectCompositesen
dc.titleApplication of X-ray microtomography to the microstructural characterization of Al-based functionally graded materialsen
dc.typeconferencePaperpor
dc.peerreviewedyespor
sdum.pagination1109-1116en
sdum.publicationstatuspublisheden
sdum.volume45en
sdum.journalAdvances in Science and Technologypor
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