Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/3834
Registo completo
Campo DC | Valor | Idioma |
---|---|---|
dc.contributor.author | Correia, J. H. | - |
dc.contributor.author | Graaf, G. de | - |
dc.contributor.author | Bartek, M. | - |
dc.contributor.author | Wolffenbuttel, R. F. | - |
dc.date.accessioned | 2006-01-06T12:41:50Z | - |
dc.date.available | 2006-01-06T12:41:50Z | - |
dc.date.issued | 2001-12 | - |
dc.date.submitted | 2001-03-01 | - |
dc.identifier.citation | "IEEE Transactions Instrumentation and Measurement". ISSN 0018-9456. 50:6 (2001) 1530-1537. | eng |
dc.identifier.issn | 0018-9456 | eng |
dc.identifier.uri | https://hdl.handle.net/1822/3834 | - |
dc.description.abstract | A single-chip CMOS optical microspectrometer containing an array of 16 addressable Fabry–Perot (F–P) etalons (each one with different resonance cavity length), photodetectors, and circuits for readout, multiplexing, and driving a serial bus interface has been fabricated in a standard 1.6- m CMOS technology (chip area 3 9 4 2 mm2). The result is a chip that can operate using only four external connections (including dd and ss) covering the optical range of 380–500 nm with FWHM = 18 nm. Frequency output and serial bus interface alloweasy multisensor, multichip interfacing using a microcontroller or a personal computer. Also, stray-light compensation techniques are implemented. Power consumption is 1250 W at a clock frequency of 1 MHz. | eng |
dc.description.sponsorship | STW - Project DEL 55.3733. TU Delft. Fundação para a Ciência e Tecnologia - Praxis XXI-BD/5181/95. | eng |
dc.language.iso | eng | eng |
dc.publisher | IEEE | eng |
dc.rights | openAccess | eng |
dc.subject | CMOS optical microspectrometer | eng |
dc.subject | Light-to-frequency converter | eng |
dc.title | A CMOS optical microspectrometer with light-to-frequency converter, bus interface, and stary-light compensation | eng |
dc.type | article | por |
dc.peerreviewed | yes | eng |
dc.relation.publisherversion | https://ieeexplore.ieee.org/document/982940 | eng |
sdum.number | 6 | eng |
sdum.pagination | 1530-1537 | eng |
sdum.publicationstatus | published | eng |
sdum.volume | 50 | eng |
dc.identifier.doi | 10.1109/19.982940 | - |
sdum.journal | IEEE Transactions on Instrumentation and Measurement | por |
Aparece nas coleções: | DEI - Artigos em revistas internacionais |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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I&M_trans.pdf | Documento principal | 434,59 kB | Adobe PDF | Ver/Abrir |