Auto-calibration of capacitive MEMS accelerometers based on pull-in voltage

dc.contributor.authorRocha, Luís A.
dc.contributor.authorDias, R. A.
dc.contributor.authorCretu, E.
dc.contributor.authorMol, L.
dc.contributor.authorWolffenbuttel, R. F.
dc.date.accessioned2011-11-29T17:09:21Z
dc.date.available2011-11-29T17:09:21Z
dc.date.issued2011-03
dc.description.abstractThis paper describes an electro-mechanical auto-calibration technique for use in capacitive MEMS accelerometers. Auto-calibration is achieved using the combined information derived from an initial measurement of the resonance frequency and the measurement of the pull-in voltages during device operation, with an estimation of process-induced variations in device dimensions from layout and deviations in material properties from the known nominal value. An experiment-based analytical model is used to compute the required electrostatic forces required to simulate external accelerations allowing the electro-mechanical calibration of the accelerometer. Measurements on fabricated devices confirm the validity of the proposed technique and electro-mechanical calibration is experimentally demonstrated.por
dc.distributioninternational
dc.identifier.doi10.1007/s00542-011-1252-8por
dc.identifier.issn0946-7076por
dc.identifier.issn1432-1858por
dc.identifier.urihttps://hdl.handle.net/1822/14654
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherSpringer por
dc.relation.publisherversionhttp://www.springerlink.com/por
dc.rightsrestrictedAccesspor
dc.subjectMicrosystemspor
dc.subjectAuto-calibrationpor
dc.subject.wosScience & Technologypor
dc.titleAuto-calibration of capacitive MEMS accelerometers based on pull-in voltagepor
dc.typearticle
dspace.entity.typePublicationen
oaire.citationEndPage436por
oaire.citationIssue3por
oaire.citationStartPage429por
oaire.citationTitleMicrosystems Technologypor
oaire.citationVolume17por
sdum.journalMicrosystems Technologypor
sdum.publicationstatuspublishedpor

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