Auto-calibration of capacitive MEMS accelerometers based on pull-in voltage
| dc.contributor.author | Rocha, Luís A. | |
| dc.contributor.author | Dias, R. A. | |
| dc.contributor.author | Cretu, E. | |
| dc.contributor.author | Mol, L. | |
| dc.contributor.author | Wolffenbuttel, R. F. | |
| dc.date.accessioned | 2011-11-29T17:09:21Z | |
| dc.date.available | 2011-11-29T17:09:21Z | |
| dc.date.issued | 2011-03 | |
| dc.description.abstract | This paper describes an electro-mechanical auto-calibration technique for use in capacitive MEMS accelerometers. Auto-calibration is achieved using the combined information derived from an initial measurement of the resonance frequency and the measurement of the pull-in voltages during device operation, with an estimation of process-induced variations in device dimensions from layout and deviations in material properties from the known nominal value. An experiment-based analytical model is used to compute the required electrostatic forces required to simulate external accelerations allowing the electro-mechanical calibration of the accelerometer. Measurements on fabricated devices confirm the validity of the proposed technique and electro-mechanical calibration is experimentally demonstrated. | por |
| dc.distribution | international | |
| dc.identifier.doi | 10.1007/s00542-011-1252-8 | por |
| dc.identifier.issn | 0946-7076 | por |
| dc.identifier.issn | 1432-1858 | por |
| dc.identifier.uri | https://hdl.handle.net/1822/14654 | |
| dc.language.iso | eng | por |
| dc.peerreviewed | yes | por |
| dc.publisher | Springer | por |
| dc.relation.publisherversion | http://www.springerlink.com/ | por |
| dc.rights | restrictedAccess | por |
| dc.subject | Microsystems | por |
| dc.subject | Auto-calibration | por |
| dc.subject.wos | Science & Technology | por |
| dc.title | Auto-calibration of capacitive MEMS accelerometers based on pull-in voltage | por |
| dc.type | article | |
| dspace.entity.type | Publication | en |
| oaire.citationEndPage | 436 | por |
| oaire.citationIssue | 3 | por |
| oaire.citationStartPage | 429 | por |
| oaire.citationTitle | Microsystems Technology | por |
| oaire.citationVolume | 17 | por |
| sdum.journal | Microsystems Technology | por |
| sdum.publicationstatus | published | por |
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