Study of indium tin oxide thin films deposited on acrylics substrates by Ion beam assisted deposition technique

dc.contributor.authorMeng Lijian
dc.contributor.authorLiang Erjun
dc.contributor.authorGao Jinsong
dc.contributor.authorTeixeira, Vasco M. P.
dc.contributor.authorSantos, M. P. dos
dc.date.accessioned2011-09-19T13:38:15Z
dc.date.available2011-09-19T13:38:15Z
dc.date.issued2009-07
dc.date.submitted2008-02-15
dc.description.abstractIndium tin oxide (ITO) thin films have been deposited onto acrylics (PMMA) substrates by ion beam assisted deposition technique at different oxygen flows. The structural, optical and electrical properties of the deposited films have been characterized by X-ray diffraction, transmittance, FTIR, ellipometry and Hall effect measurements. The optical constants of the deposited films have been calculated by fitting the ellipsometric spectra. The effects of the oxygen flow on the properties of the deposited films have been studied. It has been found that 40 sccm oxygen flow is an optimum value for getting the films with good transmittance and low electrical resistivity.por
dc.identifier.doi10.1166/jnn.2009.M24por
dc.identifier.issn1533-4880por
dc.identifier.urihttps://hdl.handle.net/1822/13626
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherAmerican Scientific Publisherspor
dc.relation.publisherversionhttp://www.ingentaconnect.com/content/asp/jnn/2009/00000009/00000007/art00024?token=004619196b767e57a7e41225f40386f2c4b46527d763b24442a576b64276abc986af9fpor
dc.rightsopenAccesspor
dc.subjectITOpor
dc.subjectOptical propertiespor
dc.subjectThin filmpor
dc.subjectPMMApor
dc.subjectIon beam assisted depositionpor
dc.subjectIndium tin oxidepor
dc.subject.wosScience & Technologypor
dc.titleStudy of indium tin oxide thin films deposited on acrylics substrates by Ion beam assisted deposition techniquepor
dc.typearticlepor
dspace.entity.typePublicationen
oaire.citationEndPage4155por
oaire.citationIssue7por
oaire.citationStartPage4151por
oaire.citationTitleJournal of Nanoscience and Nanotechnologypor
oaire.citationVolume9por
sdum.journalJournal of Nanoscience and Nanotechnologypor
sdum.publicationstatuspublishedpor

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