Optical and structural analysis of solar selective absorbing coatings based on AlSiOx:W cermets

dc.contributor.authorDias, D.por
dc.contributor.authorRebouta, L.por
dc.contributor.authorCosta, P.por
dc.contributor.authorAl-Rjoub, A.por
dc.contributor.authorBenelmeki, M.por
dc.contributor.authorTavares, C. J.por
dc.contributor.authorBarradas, N. P.por
dc.contributor.authorAlves, E.por
dc.contributor.authorSantilli, P.por
dc.contributor.authorPischow, K.por
dc.date.accessioned2017-11-13T16:07:11Z
dc.date.available2017-11-13T16:07:11Z
dc.date.issued2017-07-01
dc.date.updated2017-11-13T11:22:15Z
dc.description.abstractIt is reported in this work the development and study of the optical and structural properties of a solar selective absorber cermet based on AlSiOx:W. A four-layer composite film structure, W/AlSiOx:W(HA)/AlSiOx:W(LA)/AlSiOx, was deposited on stainless steel substrates using the magnetron sputtering deposition method. Numerical calculations were performed to simulate the spectral properties of multilayer stacks with varying metal volume fraction cermets and film thickness. The chemical analysis was performed using X-ray photoelectron spectroscopy and the results show that in the high metal volume fraction cermet layer, AlSiOx:W(HA), about one third of W atoms are in the W-O oxidation state, another third in the Wx+ oxidation state and the last third in the W4+, W5+ and W6+ oxidation states. The X-ray diffractograms of AlSiOx:W layers show a broad peak indicating that both, W and AlSiOx, are amorphous. These results indicate that this film structure has a good spectral selective property that is suitable for solar thermal applications, with the coatings exhibiting a solar absorptance of 94-95.5% and emissivities of 8-9% (at 100 degrees C) and 10-14% (at 400 degrees C). The samples were subjected to a thermal annealing at 450 degrees C, in air, and 580 degrees C, in vacuum and showed very good oxidation resistance and thermal stability. Morphological characterizations were carried out using scanning electron microscopy and atomic force microscopy. Rutherford Backscattering experiments were also performed to analyze the tungsten depth profile.por
dc.description.publicationversioninfo:eu-repo/semantics/publishedVersionpor
dc.description.sponsorshipThe authors acknowledge the support of the Portuguese Foundation for Science and Technology (FCT) in the framework of the Strategic Funding UID/FIS/04650/2013. The authors are also grateful to the financial support of FCT, POCI and PORL operational programs through the project POCI-01-0145-FEDER-016907 (PTDC/CTM-ENE/2882/2014), co-financed by European community fund FEDER. The authors also acknowledge GIST Japan for using the XPS-Kratos.por
dc.distributioninternationalpor
dc.identifier.doi10.1016/j.solener.2017.04.055por
dc.identifier.issn0038-092Xpor
dc.identifier.urihttps://hdl.handle.net/1822/47284
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherElsevierpor
dc.relationinfo:eu-repo/grantAgreement/FCT/5876/147414/PTpor
dc.relationPTDC/CTM-ENE/2882/2014por
dc.rightsopenAccesspor
dc.subjectSolar selective absorberpor
dc.subjectAlSiOx:W cermetpor
dc.subjectOptical constantspor
dc.subjectDielectric function modellingpor
dc.subjectSputtering, solar thermalpor
dc.subjectAlSiO :W cermet xpor
dc.subject.wosScience & Technology
dc.titleOptical and structural analysis of solar selective absorbing coatings based on AlSiOx:W cermetspor
dc.typearticle
dspace.entity.typePublicationen
oaire.citationEndPage344por
oaire.citationStartPage335por
oaire.citationVolume150por
sdum.export.identifier1083
sdum.journalSolar Energypor

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