Effect of grain size and hydrogen passivation on the electrical properties of nanocrystalline silicon films

dc.contributor.authorCerqueira, M. F.
dc.contributor.authorSemikina, T. V.
dc.contributor.authorBaidus, N. V.
dc.contributor.authorAlves, E.
dc.date.accessioned2011-09-30T14:52:44Z
dc.date.available2011-09-30T14:52:44Z
dc.date.issued2010
dc.description.abstractThe properties of mixed-phase (nanocrystalline/amorphous) silicon layers produced by reactive RF-sputtering are described. The chemical composition and nanostructure [i.e. nanocrystal (NC) size and volume fraction] of the films were studied by Rutherford backscattering spectroscopy (RBS) and micro-Raman spectroscopy, respectively. Samples with different fractions of the nanocrystalline phase and NC mean size were produced by changing the deposition parameters, without post-growth annealing. The electrical conductivity of the films, measured as function of temperature, is discussed in relation to their nanostructurepor
dc.description.sponsorshipFCT Project POCTI/CTM/39395/2001por
dc.identifier.doi10.1504/IJMPT.2010.034271por
dc.identifier.issn0268-1900por
dc.identifier.urihttps://hdl.handle.net/1822/13751
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherIndersciencepor
dc.relationinfo:eu-repo/grantAgreement/FCT/POCI/39395/PT
dc.relation.publisherversionhttp://www.inderscience.com/search/index.php?action=record&rec_id=34271por
dc.rightsopenAccesspor
dc.subjectAmorphous siliconpor
dc.subjectNanocrystalpor
dc.subjectRaman spectroscopypor
dc.subjectElectrical propertiespor
dc.subject.wosScience & Technologypor
dc.titleEffect of grain size and hydrogen passivation on the electrical properties of nanocrystalline silicon filmspor
dc.typearticlepor
dspace.entity.typePublicationen
oaire.citationEndPage204por
oaire.citationIssue1-2por
oaire.citationStartPage195por
oaire.citationTitleInternational Journal of Materials and Product Technologypor
oaire.citationVolume39por
sdum.journalInternational Journal of Materials and Product Technologypor
sdum.publicationstatuspublishedpor

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