Characterization of TiAl alloys by secondary Ion mass spectrometry
| dc.contributor.author | Barbosa, J. | |
| dc.contributor.author | Teodoro, O. M. N. D. | |
| dc.contributor.author | Ribeiro, Carlos Silva | |
| dc.contributor.author | Moutinho, A. M. C. | |
| dc.contributor.author | Monteiro, A. Caetano | |
| dc.date.accessioned | 2011-05-23T07:59:17Z | |
| dc.date.available | 2011-05-23T07:59:17Z | |
| dc.date.issued | 2004 | |
| dc.description.abstract | Titanium aluminides are arising as a valuable alternative to superalloys in applications where the ratio resistance/density is important. Together with excellent mechanical and corrosion properties at high temperatures, such characteristics are very attractive for applications in the aeronautical, aerospace and automotive industries. However, the current high selling price, due to high costs of production and raw materials and the need of very specific equipment, are limitative factors for further applications. With the end of the cold war, and the decrease of traditional markets of TiAl, the strategy to develop other applications, strongly depends on the decrease of production costs. An alternative to the present production routes might be the use of traditional casting techniques, by induction melting of the alloy in a ceramic crucible and pouring into ceramic moulds, made by the investment casting process. However, due to the high reactivity of Ti alloys, the use of traditional ceramic materials cannot be used, as they lead to oxide formation and oxygen pick up both from the crucible and the moulding materials. In this work, the relative oxygen concentration of Ti-48Al castings was measured by SIMS — Secondary Ion Mass Spectrometry. This technique provides a direct measurement of the isotopic composition with high sensitivity. The cylindrical samples were specially prepared to allow the analysis of the area close to the border. Oxygen profiles were acquired for samples obtained by with different mould materials. The comparison of such profiles with hardness profiles, give insight in the significance of the oxygen concentration in the properties of the alloy and in the choice of the most suitable materials for TiAl production | por |
| dc.description.sponsorship | (undefined) | por |
| dc.distribution | international | por |
| dc.identifier.citation | Barbosa, J., Teodoro, O. M. N. D., Moutinho, A. M. C., Ribeiro, S. J. L., & Monteiro, C. (2004, May 15). Characterization of TiAl Alloys by Secondary Ion Mass Spectrometry. Materials Science Forum. Trans Tech Publications, Ltd. http://doi.org/10.4028/www.scientific.net/msf.455-456.653 | por |
| dc.identifier.doi | 10.4028/www.scientific.net/msf.455-456.653 | |
| dc.identifier.isbn | 0878499415 | por |
| dc.identifier.issn | 1662-9752 | por |
| dc.identifier.uri | https://hdl.handle.net/1822/12445 | |
| dc.language.iso | eng | por |
| dc.peerreviewed | yes | por |
| dc.publisher | Trans Tech Publications Ltd | por |
| dc.relation.publisherversion | http://doi.org/10.4028/www.scientific.net/msf.455-456.653 | |
| dc.rights | openAccess | por |
| dc.subject | TiAl | por |
| dc.subject | SIMS | por |
| dc.subject | Induction | por |
| dc.subject | Melting | por |
| dc.subject | Investment casting | por |
| dc.subject | induction melting | por |
| dc.subject | surface/interface analysis | por |
| dc.subject.wos | Science & Technology | por |
| dc.title | Characterization of TiAl alloys by secondary Ion mass spectrometry | por |
| dc.type | conferencePaper | eng |
| dspace.entity.type | Publication | en |
| oaire.citationEndPage | 656 | por |
| oaire.citationStartPage | 653 | por |
| oaire.citationTitle | Materials Science Forum | por |
| oaire.citationVolume | 455-456 | por |
| sdum.conferencePublication | ADVANCED MATERIALS FORUM II | por |
| sdum.journal | Materials Science Forum | por |
| sdum.publicationstatus | published | por |
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