Yam parameterization based on mass analysis
| dc.contributor.author | Carvalho, Vítor | |
| dc.contributor.author | Pinto, J. G. | |
| dc.contributor.author | Monteiro, João L. | |
| dc.contributor.author | Vasconcelos, Rosa | |
| dc.contributor.author | Soares, Filomena | |
| dc.date.accessioned | 2009-06-02T15:40:36Z | |
| dc.date.available | 2009-06-02T15:40:36Z | |
| dc.date.issued | 2004-06-11 | |
| dc.date.submitted | 2003-10-10 | |
| dc.description.abstract | The aim of this paper is to present a new experimental procedure to evaluate yarn characteristics, in real time, using capacitive sensors with a width below 8 mm (commercial equipments use 8 mm sensors). The new approach allows a direct measurement in 1 mm range (increasing resolution eight times). Using software modules developed in this project, all yarn parameters commonly used in industry are evaluated, often with different percentiles. These percentiles are defined interactively with the operator. To increase the textile assessment of the yarn, new parameters were developed (integral deviation rate (IDR), fast fourier transform (FFT)-based analysis) and others were adapted (deviation rate (DR), spectrogram). The final goal of the current project is to allow real time actuation on a ring spinning frame, based on the previous analysis of the yarn. This allows on-line control of the production according pre-defined quality requirements. | en |
| dc.distribution | international | por |
| dc.identifier.citation | “Sensors and Actuators A”. ISSN 0924-4247. 115 (June 2004) 540-548. | en |
| dc.identifier.doi | 10.1016/j.sna.2004.04.045 | por |
| dc.identifier.issn | 0924-4247 | en |
| dc.identifier.uri | https://hdl.handle.net/1822/9285 | |
| dc.language.iso | eng | en |
| dc.peerreviewed | yes | por |
| dc.publisher | Elsevier | en |
| dc.relation.publisherversion | www.elsevier.com | en |
| dc.rights | openAccess | en |
| dc.subject | Yarn eveness | en |
| dc.subject | Capacitive sensor | en |
| dc.subject | Signal processing | en |
| dc.subject | Spectral analysis | en |
| dc.subject | yam evenness | por |
| dc.subject | Yarn evenness | por |
| dc.subject.wos | Science & Technology | por |
| dc.title | Yam parameterization based on mass analysis | eng |
| dc.type | article | por |
| dspace.entity.type | Publication | en |
| oaire.citationEndPage | 548 | por |
| oaire.citationIssue | 2-3 | por |
| oaire.citationStartPage | 540 | por |
| oaire.citationVolume | 115 | por |
| sdum.journal | Sensors and Actuators A: Physical | por |
| sdum.pagination | 540-548 | en |
| sdum.publicationstatus | published | en |
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