Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/13772
Título: | Visible and infrared photoluminescence from erbium-doped silicon nanocrystals produced by rf sputtering |
Autor(es): | Cerqueira, M. F. Losurdo, M. Monteiro, T. Stepikhova, M. Soares, Manuel Jorge Peres, M. Alpuim, P. |
Palavras-chave: | Erbium-doped Low-dimensional Si films Optical properties Spectroscopic ellipsometry |
Data: | 2007 |
Editora: | Wiley-VCH Verlag |
Revista: | physica status solidi (a) |
Resumo(s): | Erbium-doped low-dimensional Si films with different microstructures were deposited by reactive magnetron sputtering on glass substrates by varying the hydrogen flow rate during deposition. Amorphous, micro- and nanocrystalline samples, consisting of Si nanocrystalls embedded in silicon-based matrices with different structures, were achieved with optical properties in the visible and IR depending on nanocrystalline fraction and matrix structure and chemical composition. Structural characterization was performed by X-ray diffraction in the grazing incidence geometry and Raman spectroscopy. The chemical composition was studied using RBS/ERD techniques. Spectroscopic ellipsometry was combined with the previous techniques to further re-solve the film microstructure and composition. In particular, the distribution along the film thickness of the volume fractions of nanocrystalline/amorphous silicon and SiOx phases has been obtained. In this contribution we discuss visible and infrared photoluminescence as a function of sample microstructure and of the oxygen/ hydrogen concentration ratio present in the matrix. |
Tipo: | Artigo |
URI: | https://hdl.handle.net/1822/13772 |
DOI: | 10.1002/pssa.200675350 |
ISSN: | 1862-6300 |
Versão da editora: | http://onlinelibrary.wiley.com/doi/10.1002/pssa.200675350/pdf |
Arbitragem científica: | yes |
Acesso: | Acesso aberto |
Aparece nas coleções: | CDF - FMNC - Artigos/Papers (with refereeing) |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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VisIRPL-SiEr-PSSa-2007.pdf | Documento principal | 437,5 kB | Adobe PDF | Ver/Abrir |