Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/6328

TítuloOptimised filters for texture defect detection
Autor(es)Sobral, João Luís Ferreira
Palavras-chaveWavelet
Defect detection
Leather inspection
Data2005
EditoraIEEE
RevistaIEEE International Conference on Image Processing (ICIP)
CitaçãoIEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING, Genova, Italy, 2005 – “ICIP-05 : proceedings of the IEEE International Conference on Image Processing.” [S.l.] : IEEE Computer Society Press, 2005. ISBN 0-7803-9134-9.
Resumo(s)This paper presents a new approach to texture defect detection based on a set of optimised filters. Each filter is applied to one wavelet sub-band and its size and shape are tuned for a defect type. The wavelet transform provides a very efficient way to decompose a complex texture into a set of base components (wavelet sub-bands), which are then analysed by each filter to detect a kind of defect. The proposed methodology has been successfully applied to leather inspection, achieving the detection rate of highly trained human operators. The process is also fast enough to be used for in-line inspection.
TipoArtigo em ata de conferência
URIhttps://hdl.handle.net/1822/6328
ISBN0-7803-9134-9
DOI10.1109/ICIP.2005.1530454
ISSN1522-4880
Arbitragem científicayes
AcessoAcesso aberto
Aparece nas coleções:DI/CCTC - Artigos (papers)

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